Advanced Surveying - Part 1 Online Exam Quiz
Advanced Surveying - Part 1 GK Quiz. Question and Answers related to Advanced Surveying - Part 1. MCQ (Multiple Choice Questions with answers about Advanced Surveying - Part 1
The point on the celestial sphere vertically below the observer's position, is called
Options
A : zenith
B : celestial point
C : nadir
D : pole.
The parallax equation is applicable to entire overlap of the photographs only if parallax is measured
Options
A : normal to base line
B : parallel to base line
C : both (a) and (b)
D : neither (a) nor (b).
The stereo plotting instruments are generally manufactured on the principle of
Options
A : optical projection
B : optical mechanism projection
C : mechanical projection
D : all the above.
International date line is located along
Options
A : standard meridian
B : Greenwich meridian
C : equator
D : 180° longitude
The shortest distance between two places measured along the surface of the earth, is
Options
A : length of the equator between their longitudes
B : length of the parallel between their longitudes
C : length of the arc of the great circle passing through them
D : none of these.
The correction for parallax, is
Options
A : - 8".8 cos ?
B : + .8" sin ?
C : + 8".8 cos ?
D : - 8".8 cos ?.
The angle between the plane of the equator and the plane of the ecliptic, is known as obliquity of the ecliptic and its value is
Options
A : 22° 30'
B : 23° 27'
C : 23° 30'
D : 24° 0'.
Perspective centre relates to
Options
A : parallel projection
B : orthogonal projection
C : central projection
D : none of these.
The most convenient co-ordinate system for specifying the relative positions of heavenly bodies on the celestial sphere, is
Options
A : altitude and azimuth system
B : declination and hour angle system
C : declination and right ascension system
D : declination and altitude system
In a tropical year, the number of sidereal days, are
Options
A : 365
B : 365.2224
C : 365.2422
D : 366.2422
Advanced Surveying - Part 1 more Online Exam Quiz
Process Control and Instrumentation - Part 1
Process Equipment and Plant Design - Part 1
Refractory Technology - Part 1